Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy

Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy

von: K. C. Khulbe, C. Y. Feng, Takeshi Matsuura

Springer-Verlag, 2007

ISBN: 9783540739944 , 198 Seiten

Format: PDF

Kopierschutz: Wasserzeichen

Windows PC,Mac OSX Apple iPad, Android Tablet PC's

Preis: 117,69 EUR

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Synthetic Polymeric Membranes - Characterization by Atomic Force Microscopy


 

Researchers in polymeric membranes as well as R&D professionals will find this work an essential addition to the literature. It concentrates on the method recently developed to study the surfaces of synthetic polymeric membranes using an Atomic Force Microscope (AFM), which is fast becoming a very important tool. Each chapter includes information on basic principles, commercial applications, an overview of current research and guidelines for future research.